Measurement of Structural Properties of Coated Paper by X-Ray Microtomography, 2008 PAPERCON Conference

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This paper reports a technique, based on analysis of X-ray micro-tomographyiƒÊCT) images to analyze the internal properties of coated paper through the thickness direction (ZD). The image analysis method for paper applications using ƒÊCT have been developed by a few groups, but the method that can analyze these images to obtain the full range of properties in detail has not been presented before.