Reflectometry and Polarized Light for Studies of Paper Coating Structure, 2005 TAPPI Coating Conference
Polarized light reflectometry is a powerful non-contact method for obtaining information about paper coating
structure, roughness and optical properties. A new instrument, an imaging reflectometer, has recently become
available and makes reflectometry far more accessible as a practical tool for industrial users. Basic data obtained
from the reflectometer include refractive index, microroughness (surface roughness smaller than the wavelength of
light), macroroughness (surface roughness greater than the wavelength of light), plus various gloss and reflectance
parameters. Data obtained from analysis of a wide range of coated papers from pilot and mill trials show how
reflectometry can provide useful insights into coating structure (notably surface porosity), permit distinction
between coating pigment and basesheet roughness features and quantify physical origins of sheet gloss.
Reflectometry and Polarized Light for Studies of Paper Coating Structure, 2005 TAPPI Coating Confere