Using a Defocused Argon Ion Beam to Prepare Coated Paper Cross-Sections, 2006 International Conference on Nanotechnology
This report will describe the application of de-focused Argon ion beam technology for preparing cross-sections of coated paper for SEM/EDX analysis. Comparison of this sample preparation technique with other accepted cross-section techniques will be reviewed. Cross-section images of printed and unprinted coated paper samples showing the advantages of this technique will be presented. The strengths and currently identified limitations of this new method will also be discussed.