New Optical Technology for On-Line Layer & Coat-Weight Thickness Measurements, 2008 PLACE Conference

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Spectral Coherence Interferometry (SCI) provides layer and coatweight thickness measurement capabilities not possible using other available technologies. Simultaneous and independent thickness measurements of layers and coatings, individually and in total, can now be performed on-line and in real time.

The increasing demand for highly accurate thickness measurements of laminations, coatings, and films, often reveals the limitations of customary on-line measurement technologies such as nuclear, near infrared, laser, and capacitance.

Ensuring consistent product quality while expanding production and material cost savings can be accomplished through automation of inspection and manufacturing processes through utilization of reliable on-line instrumentation.