NEW METHOD TO COMPARE CD PROFILE MEASUREMENTS WITH PROCESS MEASUREMENTS, PaperCon 2010 Conference

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Profile measurements are typically visually monitored with 2D-profile maps at the mills. Profile variations are characterized with average and standard deviation calculations, which are monitored together with 2D-profiles. These two indices are typically not sufficient to characterize variations of the paper in either the MD or the CD direction. This paper will explore some other indices, but the more important exploration of this paper is a tool which can correlate calculated profile characterization indices to process measurements, in order find process changes which can cause profile changes.