Improving Paper Quality by Combining CD Profile Measurements with Process Measurements, PaperCon 2013

Please Note: This document will be available in PDF format in the "My Electronic Documents" link on the home page once your order has been completed. Please make sure you have the latest version of Acrobat Reader. Click on the Acrobat Reader icon to check for the latest version, it’s FREE. To print a hardcopy of a PDF file correctly you must have a postscript printer. If you are not sure if your printer is a postscript printer please refer to your owner’s manual.

Purchase of electronic (downloadable) documents made at www.tappi.org by credit cards, followed by instant download CANNOT be cancelled. We do not offer refunds on electronic download documents.

Profile measurements are typically monitored visually with 2D-profile maps. 2D-profile maps are usually designed for viewing purposes and it is difficult to extract useful detailed information from those. Process measurements cannot be studied together with profile maps and therefore it is not possible to perform root-cause analysis to find origin of profile quality disruptions. There is a need for flexible profile data handling system with an online connection to process data.