Using Multifactor Analysis to Identify Challenging Paper Machine Deposits and Defects, TAPPICon24

Based on its speed and versatility, Fourier transform infrared (FT-IR) spectroscopy is the industry’s common starting point for analysis of a paper machine deposit or defect sample. However, certain contaminants and papermaking process additives cannot be identified precisely solely by infrared spectral interpretation. This lack of specificity could lead to a misinterpretation of the composition of the deposit or defect. A multifactor analysis uses data from two or more analytical techniques, including FT-IR spectroscopy, microbiological staining/phase contrast microscopy, pyrolysis-gas chromatography/mass spectrometry (Pyro-GC/MS), and scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDX), to produce a more specific assessment of a sample’s composition. This paper discusses the use of multifactor analysis in deposit and defect analysis and presents several case studies that demonstrate how this comprehensive approach can often produce an interpretation result of greater conviction and value to the papermaker.

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