Enhanced Paper Machine Controls and Process Optimization with LWIR Cameras, TAPPICon26

Recent developments in thermal signature analytics allow for measurement of CD and MD temperature profiles in any paper machine location. A compact long wave infrared (LWIR) camera can be placed in locations where a QCS scanner cannot be installed, including locations near profiling equipment such as actuators, steam boxes, and re-moisturizers.

This paper presents results of a QCS bump test used to validate the proportionality of the temperature profile measured by an LWIR camera to the moisture profile measured by the scanner. The test concluded that the camera readings agreed with QCS readings in terms of alignment and response along the scanner beam, which in turn confirmed that LWIR cameras can be used as an indirect moisture sensor.

This finding combined with the camera ability to measure real-time CD and MD profiles opens new opportunities for enhanced paper machine control and process optimization with the expectation for significant savings and production gains.

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