Analysis of the Real Microstructure of the Cross Section of a Coated Layer Prepared by FIB - Novel Method for Micropore Size Distribution Measurement, 2001 Coating Conference Proceedings

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Toshiki Okayasu, Sigeharu Kusama, Eishun Tozaki, and Takashi Miyagawa--The microstructure of a coated layer of a paper, including the size distribution of its micropores, is one of the most important factors, which influence its printing characteristics. A focused ion beam (FIB) was used for preparing a cross section of coated paper. Its pore size distribution was determined from this cross section using an image analysis technique. It was shown that the FIB technique enabled the cross section to be prepared without damaging its microstructure. This contrasts with the microtome cutting technique, which results in chipping. The FIB method was used to prepare specimens of a double-coated paper, of which the pore size distribution of each layer was measured. Such analysis would be impossible with conventional methods, such as mercury porosimetry measurement.