Metallographic Preparation of Coated Papers for Backscattered Electron Imaging of Coating Structure in Cross-Section, 1998 Coating/Papermakers Conference Proceedings

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Scanning Electron Microscopy (SEM) is a powerful tool for studying the morphology of paper coatings. Problems encountered in the development and/or manufacture of coated papers can sometimes be rapidly solved by SEM of the coating surface. However, in many instances, it is necessary to study the coating morphology in cross-section. A procedure is described that produces high quality cross-section samples appropriate for high resolution backscattered electron (BSE) imaging. This method allows for the determination of pigment composition via backscattered electron image contrast, coating thickness and uniformity, base sheet uniformity and binder distribution and morphology. The sample size is sufficient to allow a large number of random areas to be imaged, insuring that the data are statistically significant. As many as five samples may be prepared in each mount and six mounts may be polished simultaneously; thus, the procedure is time and cost effective.