TAPPI Visual Inspection Charts
My TAPPI Story: McKenna Goulette
Time of Flight (ToF) secondary ion mass spectroscopy (SIMS) is a relatively new technique for probing the chemistry of surfaces. We have applied SIMS to a wide variety of papers and papermaking problems and found it to be a powerful tool for analysis and problem solving. A number of applications are discussed in detail with emphasis on problems involving defects and runnability. SIMS helped resolve a sizing problem in which we found pitch to be a highly effective desizing agent. This brings a new insight to an old problem - why some pulps are more difficult to size than others.
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Sponsored by the Recovery Boiler Program R&D Subcommittee of the American Forest & Paper Association (AF&PA) and published by TAPPI Press.
The best-selling text to introduce the entire technology of pulp and paper manufacture.
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Available for Purchase – Conference Proceedings
TAPPI maintains a record of key conference papers, presentations, and other conference publications, available for purchase in a variety of formats.
Probing Paper Surfaces with TOF SIMS- a New Tool for Problem Solving, 1996 Papermakers Conference Pr