Determination of the Spatial Distribution of Trace Elements in Jack Pine, 'Pinus banksiana' Lamb., by Imaging Microprobe Secondary Ion Mass Spectrometry, 1994 Pulping Conference Proceedings
J. H.E. Bailey, D. W. Reeve
Imaging Microprobe Secondary Ion Mass Spectrometry (SIMS) has been used in determining the spatial distribution of trace elements in jack pine, Pinus banksiana(Lamb.).1 Trace elements were found to be concentrated in specific morphological features, namely: the torus, middle lamella, cell corners and ray parenchyma wall. Middle lamella calcium ion enrichment was particularly great in the radial middle lamella near the latewood/earlywood transition. There is also evidence of calcium enrichment in the inner layer of the secondary wall in the latewood cells. Analysis of a ray cell sectioned tangentially indicates enriched concentration of the above elements in the ray parenchyma wall, however not in the ray tracheid wall.