Application of Atomic Force Microscopy in Pigment and Dispersion Coating Analysis, 1999 Coating Fundamentals Symposium Proceedings

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Kati Rissa, Mika Vähä-Nissi

Atomic force microscopy (AFM) is used to characterize the film formation of barrier latices, the effects of wax addition and calendering on dispersion coatings, and latex particle adhesion to inorganic surfaces. The main advantage of this method is the ability to perform measurements at normal atmospheric conditions with a very good

resolution.

This paper gives a short presentation of the work in the case of pigment and barrier dispersion coatings. Some examples of these studies are presented and discussed. The strong effect of drying temperature and level of wax addition on the surface topography of poly(styrene-butadiene) based dispersion was observed in the present studies. Adhesion of the SB binder to the cleavage surface of mica and the effect of pigment addition to latex were also evaluated.